Electromigration Modeling at Circuit Layout Level

This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.

Verlag: Springer London, 152 Seiten

Elektronisches Format: PDF

Erscheinungsdatum: 28.03.2011

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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Produktform: Buch / Einband - flex.(Paperback)

This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.

Verlag: Springer London, Auflage 1, 152 Seiten

Erscheinungsdatum: 21.04.2013

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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Produktform: Buch / Einband - fest (Hardcover)

This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.

Verlag: Springer London, Auflage 1, 152 Seiten

Erscheinungsdatum: 07.03.2011

106,99 € inkl. MwSt.
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lieferbar - Lieferzeit 10-15 Werktage

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