Defects in SiO2 and Related Dielectrics: Science and Technology
Produktform: E-Buch Text Elektronisches Buch in proprietärem
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
213,99 € inkl. MwSt.
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Defects in SiO2 and Related Dielectrics: Science and Technology
Produktform: Buch / Einband - fest (Hardcover)
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
213,99 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
Defects in SiO2 and Related Dielectrics: Science and Technology
Produktform: Buch / Einband - flex.(Paperback)
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
213,99 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage