On-Line Testing for VLSI
Produktform: E-Buch Text Elektronisches Buch in proprietärem
96,29 € inkl. MwSt.
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On-Line Testing for VLSI
Produktform: Buch / Einband - fest (Hardcover)
106,99 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
On-Line Testing for VLSI
Produktform: Buch / Einband - flex.(Paperback)
106,99 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
Robust SRAM Designs and Analysis
Produktform: E-Buch Text Elektronisches Buch in proprietärem
This guide to Static Random Access Memory (SRAM) bitcell design and analysis meets the nano-regime challenges for CMOS devices and such emerging devices as Tunnel FETs. Offers popular SRAM bitcell topologies that mitigate variability, plus exhaustive analysis.
96,29 € inkl. MwSt.
Recommended Retail Price
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
Robust SRAM Designs and Analysis
Produktform: Buch / Einband - flex.(Paperback)
This guide to Static Random Access Memory (SRAM) bitcell design and analysis meets the nano-regime challenges for CMOS devices and such emerging devices as Tunnel FETs. Offers popular SRAM bitcell topologies that mitigate variability, plus exhaustive analysis.
106,99 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
Robust SRAM Designs and Analysis
Produktform: Buch / Einband - fest (Hardcover)
This guide to Static Random Access Memory (SRAM) bitcell design and analysis meets the nano-regime challenges for CMOS devices and such emerging devices as Tunnel FETs. Offers popular SRAM bitcell topologies that mitigate variability, plus exhaustive analysis.
149,79 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage