Design for Testability for RF Circuits and Systems
Produktform: E-Buch Text Elektronisches Buch in proprietärem
With extensive use of real silicon data, this book is a must-have reference to the most efficient, embedded Design-for-Test (DFT) methods for RF/PLL circuits and systems. Offering an industry perspective, the focus is on practical and implementation aspects.
12,99 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
VLSI-SoC: At the Crossroads of Emerging Trends
21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised Selected Papers
Produktform: E-Buch Text Elektronisches Buch in proprietärem
53,49 € inkl. MwSt.
Recommended Retail Price
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
VLSI-SoC: At the Crossroads of Emerging Trends
21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised Selected Papers
Produktform: Buch / Einband - fest (Hardcover)
53,49 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
VLSI-SoC: At the Crossroads of Emerging Trends
21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised Selected Papers
Produktform: Buch / Einband - flex.(Paperback)
53,49 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage