Recent Advances in PMOS Negative Bias Temperature Instability
Characterization and Modeling of Device Architecture, Material and Process Impact
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Fundamentals of Bias Temperature Instability in MOS Transistors
Characterization Methods, Process and Materials Impact, DC and AC Modeling
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Fundamentals of Bias Temperature Instability in MOS Transistors
Characterization Methods, Process and Materials Impact, DC and AC Modeling
Produktform: Buch / Einband - flex.(Paperback)
106,99 € inkl. MwSt.
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Fundamentals of Bias Temperature Instability in MOS Transistors
Characterization Methods, Process and Materials Impact, DC and AC Modeling
Produktform: Buch / Einband - fest (Hardcover)
106,99 € inkl. MwSt.
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Recent Advances in PMOS Negative Bias Temperature Instability
Characterization and Modeling of Device Architecture, Material and Process Impact
Produktform: Buch / Einband - fest (Hardcover)
160,49 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage
Recent Advances in PMOS Negative Bias Temperature Instability
Characterization and Modeling of Device Architecture, Material and Process Impact
Produktform: Buch / Einband - flex.(Paperback)
160,49 € inkl. MwSt.
kostenloser Versand
lieferbar - Lieferzeit 10-15 Werktage