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Applications of Statistical and Field Theory Methods to Condensed Matter

Produktform: Buch / Einband - fest (Hardcover)

There is no doubt that we have, during the last decade, moved into a "golden age" of condensed matter science. The sequence of discoveries of novel new states of matter and their rapid assimilation into experimental and theoretical research, as well as devices, has been remarkable. To name but a few: spin glasses; incommensurate, fractal, quasicrystal structures; synthetic metals; quantum well fabrication; fractional quantum Hall effect: solid state chaos; heavy fermions; and most spectacularly high-temperature superconductivity. This rapid evolution has been marked by the need to address the reality of materials in "extreme" conditions - - disordered, nonlinear systems in reduced dimensions, restricted geometries and at mesoscopic scales, often with striking competitions between several length and frequency scales, and between strong electron-phonon and electron-electron interactions. In such new territory it is not surprising that very interdisciplinary approaches are being explored and traditional boundaries between subjects and disciplines re-defined. In theory, this is evident, for instance, in attempts: (1) to advance the state of the art for elec tronic structure calculations so as to handle strongly interacting many-body systems and delicate competitions for collective ground states (spin models or many-electron Hamiltoni ans, field theory, band structure, quantum chemistry and numerical approaches); or (2) to understand pattern formation and complex (including chaotic) dynamics in extended sys tems. This demands close involvement with applied mathematics, numerical simulations and statistical mechanics techniques.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Sprache(n): Englisch

ISBN: 978-0-306-43526-3 / 978-0306435263 / 9780306435263

Verlag: Springer US

Erscheinungsdatum: 30.09.1990

Seiten: 418

Auflage: 1

Zielgruppe: Research

Herausgegeben von Dionys Baeriswyl, Alan R. Bishop, J. Camelo

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