Noch Fragen? 0800 / 33 82 637

Data-driven Methods for Fault Localization in Process Technology

Produktform: Buch / Einband - flex.(Paperback)

Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant\'s devices the fault can lead to an alarm flood. This again hides the original location of the causing device. In this work several data-driven approaches for root cause localization are proposed, compared and combined. All methods analyze disturbed process data for backtracking the propagation path.weiterlesen

Sprache(n): Englisch

ISBN: 978-3-7315-0098-8 / 978-3731500988 / 9783731500988

Verlag: KIT Scientific Publishing

Erscheinungsdatum: 24.10.2013

Seiten: 224

Autor(en): Christian Kuhnert

45,00 € inkl. MwSt.
kostenloser Versand

lieferbar - Lieferzeit 10-15 Werktage

zurück