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Design, Analysis and Test of Logic Circuits Under Uncertainty

Produktform: Buch / Einband - fest (Hardcover)

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Sprache(n): Englisch

ISBN: 978-90-481-9643-2 / 978-9048196432 / 9789048196432

Verlag: Springer Netherland

Erscheinungsdatum: 21.09.2012

Seiten: 124

Auflage: 1

Autor(en): John P. Hayes, Smita Krishnaswamy, Igor L. Markov

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