Noch Fragen? 0800 / 33 82 637

Ellipsometry of Functional Organic Surfaces and Films

Produktform: Buch / Einband - flex.(Paperback)

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Sprache(n): Englisch

ISBN: 978-3-662-51020-9 / 978-3662510209 / 9783662510209

Verlag: Springer Berlin

Erscheinungsdatum: 23.08.2016

Seiten: 363

Auflage: 1

Herausgegeben von Karsten Hinrichs, Klaus-Jochen Eichhorn

119,99 € inkl. MwSt.
kostenloser Versand

lieferbar - Lieferzeit 10-15 Werktage

zurück