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Estimating Device Reliability:

Assessment of Credibility

Produktform: Buch / Einband - fest (Hardcover)

is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include: is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICs and lasers. weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Sprache(n): Englisch

ISBN: 978-0-7923-9304-7 / 978-0792393047 / 9780792393047

Verlag: Springer US

Erscheinungsdatum: 30.11.1992

Seiten: 214

Auflage: 1

Autor(en): Franklin R. Nash

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