The book is intended to be concise but thorough. It does not attempt an encyclopedic approach, but covers in significant detail the tools commonly used in pattern recognition and machine learning, including classification, dimensionality reduction, regression, and clustering, as well as recent popular topics such as Gaussian process regression and convolutional neural networks. In addition, the selection of topics has a few features that are unique among comparable texts: it contains an extensive chapter on classifier error estimation, as well as sections on Bayesian classification, Bayesian error estimation, separate sampling, and rank-based classification. weiterlesen