The topics in this fifth volume cover the methods of measuring the properties of optical components and systems. The different fundamental techniques, such as interferometry, photometry, image analysis and polarimetry, are introduced and clearly discussed in detail. Subsequent chapters provide a survey of how to qualify optical materials, coatings and surfaces of optical components, combined with a treatment of light and radiation. As a result, this one-stop reference allows readers to select and configure metrology setups suitable to measure and qualify optical components and systems with respect to the specific requirements limiting their performance.weiterlesen