This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on the characterization of measurement system and the quantification of measurement uncertainty. It covers everything from fundamentals to special topics, each illustrated with case studies from the authors' work in the National Security Enterprise (NSE). The resulting work provides readers with a solid understanding of how to apply the covered techniques to metrology in a wide variety of contexts.The methodologies presented are supported with R script when appropriate, and the code has been made available to readers for use in their own applications. The volume also offers particular attention to design of experiments (DOEx), and addresses special topics such as statistical process control (SPC) in metrology, assessment of binary measurement systems, uncertainty quantification for "one-shot" devices, and new material on sample size selection in metrology studies. Designed to promote the collaboration between statistics and metrology, this book will be of use to practitioners using measurement science, researchers, and advanced undergraduate and graduate students in statistics and engineering disciplines. weiterlesen