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Metal-Dielectric Interfaces in Gigascale Electronics

Thermal and Electrical Stability

Produktform: E-Buch Text Elektronisches Buch in proprietärem

 provides a unifying approach to the diverse and sometimes contradictory test results that are reported in the literature on metal-dielectric interfaces. The goal is to provide readers with a clear account of the relationship between interface science and its applications in interconnect structures. The material presented here will also be of interest to those engaged in field-effect transistor and memristor device research, as well as university researchers and industrial scientists working in the areas of electronic materials processing, semiconductor manufacturing, memory chips, and IC design.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Elektronisches Format: PDF

Sprache(n): Englisch

ISBN: 978-1-4614-1812-2 / 978-1461418122 / 9781461418122

Verlag: Springer US

Erscheinungsdatum: 02.02.2012

Seiten: 149

Autor(en): Ming He, Toh-Ming Lu

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