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Metrology and Physical Mechanisms in New Generation Ionic Devices

Produktform: E-Buch Text Elektronisches Buch in proprietärem

This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.  weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Elektronisches Format: PDF

Sprache(n): Englisch

ISBN: 978-3-319-39531-9 / 978-3319395319 / 9783319395319

Verlag: Springer International Publishing

Erscheinungsdatum: 18.06.2016

Seiten: 175

Autor(en): Umberto Celano

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