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Noncontact Atomic Force Microscopy

Produktform: Buch / Einband - fest (Hardcover)

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Sprache(n): Englisch

ISBN: 978-3-540-43117-6 / 978-3540431176 / 9783540431176

Verlag: Springer Berlin

Erscheinungsdatum: 24.07.2002

Seiten: 440

Auflage: 1

Herausgegeben von E. Meyer, Roland Wiesendanger, S. Morita

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