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Progress in Transmission Electron Microscopy 1

Concepts and Techniques

Produktform: Buch / Einband - fest (Hardcover)

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Sprache(n): Englisch

ISBN: 978-3-540-67680-5 / 978-3540676805 / 9783540676805

Verlag: Springer Berlin

Erscheinungsdatum: 18.10.2001

Seiten: 367

Auflage: 1

Herausgegeben von Xiao-Feng Zhang, Ze Zhang

160,49 € inkl. MwSt.
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