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Reliability of MEMS

Testing of Materials and Devices

Produktform: E-Buch Text Elektronisches Buch in proprietärem

This edition of 'Reliability of MEMS' was originally published in the successful series 'Advanced Micro & Nanosystems'. Here, one of the most important hurdles to commercialization for microelectromechanical systems is covered in detail: the reliability of MEMS materials and devices. Due to their microscale size combined with novel functionalities, a whole new category of challenges arises, and proper determination of a given device's reliability is instrumental in determining its range of usability and application fields. Any kind of gadget's performance, lifetime and safety will depend on the continued and predictable functioning of both the electronic as well as the micromechanical parts. MEMS reliability therefore can be as serious as human life-and-death matters - quite literally in the case of roll-over sensors for cars, for example. weiterlesen

Elektronisches Format: PDF

Sprache(n): Englisch

ISBN: 978-3-527-67503-6 / 978-3527675036 / 9783527675036

Verlag: Wiley-VCH

Erscheinungsdatum: 26.03.2013

Seiten: 324

Auflage: 1

Reihe herausgegeben von Oliver Brand, Gary K. Fedder, Christofer Hierold, Jan G. Korvink
Herausgegeben von Osamu Tabata, Toshiyuki Tsuchiya

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