Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
Produktform: E-Buch Text Elektronisches Buch in proprietärem