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Scanning Tunneling Microscopy and Its Application

Produktform: Buch / Einband - flex.(Paperback)

presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Sprache(n): Englisch

ISBN: 978-3-642-08500-0 / 978-3642085000 / 9783642085000

Verlag: Springer Berlin

Erscheinungsdatum: 01.12.2010

Seiten: 370

Auflage: 2

Autor(en): Chunli Bai

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