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Strain Effect in Semiconductors

Theory and Device Applications

Produktform: Buch / Einband - fest (Hardcover)

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.weiterlesen

Sprache(n): Englisch

ISBN: 978-1-4419-0551-2 / 978-1441905512 / 9781441905512

Verlag: Springer US

Erscheinungsdatum: 04.12.2009

Seiten: 350

Auflage: 1

Autor(en): Yongke Sun, Scott E. Thompson, Toshikazu Nishida

160,49 € inkl. MwSt.
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lieferbar - Lieferzeit 10-15 Werktage

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