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Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Produktform: Buch / Einband - flex.(Paperback)

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.weiterlesen

Sprache(n): Englisch

ISBN: 978-3-7315-0038-4 / 978-3731500384 / 9783731500384

Verlag: KIT Scientific Publishing

Erscheinungsdatum: 18.07.2013

Seiten: 160

Autor(en): Mahtab Niknahad

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