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VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Produktform: E-Buch Text Elektronisches Buch in proprietärem

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Elektronisches Format: PDF

Sprache(n): Englisch

ISBN: 978-9811359507 / 978-9811359507 / 9789811359507

Verlag: Springer Singapore

Erscheinungsdatum: 24.01.2019

Seiten: 722

Herausgegeben von Virendra Singh, S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani

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