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VLSI for Embedded Intelligence

Proceedings of the 27th International Symposium, VDAT 2023

Produktform: E-Buch Text Elektronisches Buch in proprietärem

This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Elektronisches Format: PDF

Sprache(n): Englisch

ISBN: 978-9819737567 / 978-9819737567 / 9789819737567

Verlag: Springer Singapore

Erscheinungsdatum: 08.12.2024

Seiten: 386

Herausgegeben von Anu Gupta, Jai Gopal Pandey, Nitin Chaturvedi, Devesh Dwivedi

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