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VLSI-SoC: Design for Reliability, Security, and Low Power

23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Produktform: E-Buch Text Elektronisches Buch in proprietärem

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.weiterlesen

Dieser Artikel gehört zu den folgenden Serien

Elektronisches Format: PDF

Sprache(n): Englisch

ISBN: 978-3-319-46097-0 / 978-3319460970 / 9783319460970

Verlag: Springer International Publishing

Erscheinungsdatum: 12.09.2016

Seiten: 223

Herausgegeben von Ricardo Reis, Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi

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