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X-ray and Image Analysis in Electron Microscopy

Produktform: Buch / Einband - flex.(Paperback)

This book provides the reader with a discussion of X-ray microanalysis and imaging techniques. It is meant to be an introduction for newcomers to the fields and a reference for experienced microscopists. This third edition has been largely rewritten, reflecting the huge advances in hardware and software technology. Table of contents: I. Introduction II. Electron-specimen interaction and X-ray generation III. X-ray measurement IV. Qualitative analysis V. Quantitative analysis VI. Precision and accuracy VII. Operating conditions in the microscope VIII. Digital imaging: Processing and image math IX. Image and feature analysis X. X-ray maps and line scans XI. Application examplesweiterlesen

Sprache(n): Englisch

ISBN: 978-3-86460-674-8 / 978-3864606748 / 9783864606748

Verlag: Westarp BookOnDemand

Erscheinungsdatum: 18.04.2017

Seiten: 118

Auflage: 3

Autor(en): Martin Rohde, Stefan Langner, John J. Friel, Ralf Terborg, Tobias Salge, Jana Berlin
Herausgegeben von Bruker Nano GmbH

59,90 € inkl. MwSt.
kostenloser Versand

lieferbar - Lieferzeit 10-15 Werktage

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